Specialist Patterns特殊設計網格

特殊設計網格

Specialist Patterns

400 Mesh Reference Grid (H7)

400 Mesh Reference Grid for Electron Microscopy with Centre Mark and Locating Pointer.

Overall Diameter	3.0/3.05mm

H2A

200 Mesh Copper Reference Grid (H2A)

200 Mesh Ahera Type Reference/Finder Grid for Electron Microscopy. Designed for Asbestos TEM Analysis.

Bar Widths	Nominally 25um and 35um
Overall Diameter	3.0/3.05mm
Hole Size	Nominally 95um x 95um

go_fib_cu

GO FIB Cu

Pins numerically annotated, well-defined shape and form, shallow downset for improved performance.

3-Post Copper	End pins 180um wide, 200um length with 'V' shaped tip. Centre pin 80um wide, 200um length. 20um width shelf.
4-Post Copper	End pins 180um wide, 200um length with 'V' shaped tip. Centre pins 80um wide, 200um length. 20um width shelf.
5-Post Copper	All pins 60um wide, 200um length. 20um width shelf.
8-Post Copper	All pins 60um wide, 200um length. 20um width shelf.
Grid Thickness	Nominally 35um

go_fib_mo

GO FIB Mo

Pins individually annotated, well-defined shape and form.

3-Post FIB Lift-Out	End posts 180um wide, 200um length with 'V' shaped end. Centre post 80um wide, 200um length.
4-Post FIB Lift-Out	End posts 180um wide, 200um length with 'V' shaped end. Centre posts 80um wide, 200um length.
5-Post FIB Lift-Out	All posts 60um wide, 200um length.
8-Post FIB Lift-Out	All posts 60um wide, 200um length. 20um.
Grid Thickness	25um

9g_20h

Chien Grid (9G_20H)

Specialist Electron Microscopy Grid for Specimen Transfer.

Overall Diameter	3.0/3.05mm

11g_200

200 Mesh Grid with High Open Area (11G_200)

200 Mesh Grid for Electron Microscopy with Thinner bars for greater specimen exposure.

Overall Diameter	3.0/3.05mm

11g_400

400 Mesh Grid with High Open Area (11G_400)

400 Mesh Grid for Electron Microscopy with Thinner bars for greater specimen exposure.

Bar Thickness	0.017mm ±0.003mm
Hole Size	0.047mm ±0.003mm
Overall Diameter	3.0/3.05mm

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